New SEM instrument

Using our new scanning electron microscope, we can detect and analyze particles down to 50 nm in size. This allows for the determination of exhaust particles and other airborne particles. Impurities in, e.g., pharmaceuticals and circuit boards can also be analyzed. For this non-destructive analysis, only small amounts of material is needed. The instrument can also be used in low vacuum mode, enabling analysis of wood and paper.


For more information about SEM analyses, please contact Elke Hålenius.